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Title
Roughness-induced resonance for molecular fluorescence near a corrugated metallic surface |
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Author
Leung, P. T.; Kim, Young Sik; George, Thomas F. |
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Sponsor
This research was supported by the Air Force Office of Scientific Research, Air Force Systems Command (AFSC), United States Air Force, under Contract No. F49620-86-C-0009, by the U. S. Office of Naval Research, and by the National Science Foundation under Grant No. CHE-86-20274. |
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Abstract
Based on a dynamical energy-transfer theory for the molecular decay rate near a rough metallic surface, a new resonance structure is predicted which is mediated by the roughness and which is absent in the static image theory. The implication of this new resonance structure to other phenomena, such as electron-energy-loss spectrum and cross coupling in thin films, is pointed out. |
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Description
This is the publisher's final PDF. Article appears in Physical Review B (http://prb.aps.org/) and is copyrighted by APS Journals (http://publish.aps.org/). |
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Permanent Link
http://archives.pdx.edu/ds/psu/7675 |
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Keywords
Molecular fluorescence |
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Copyright
All data and content associated with the Portland State University Digital Repository are protected by United States copyright law. Duplication or sale of all or part of any of the data or images is not permitted without consent of the copyright holder. Use of the content is strictly for non-commercial, educational use. |
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Date
1988-11 |
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Physical Description
3 pages |
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Notes
System requirements: Adobe Acrobat Reader; Mode of access: Internet |